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J

Jean‐Pierre Raskin

uclouvain

50H-index
1.1KPaper Count
1.1WCitation Count
Published Papers 89
Publication Date
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Fully Liquid-Metal-Printed SnO₂ Thin-Film Transistors With Al₂O₃ Dielectrics
errIEEE Transactions on Electron Devices
IF3.2
err2026-02-02
err0
PREAI
errRuntong Guo; Yu Song; Annan Du; Jean-Pierre Raskin; Denis Flandre; Benjamin Iñiguez; Lei Liao; Guoli Li
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Investigation of Electrical Behavior in Back Gated Graphene FET
errMaterials Science-Medziagotyra
IF0.6
err2026-01-01
err0
PREAI
errFates, Rachid; Benkedidah, Toufik; Remmouche, Riad; Raskin, Jean-Pierre
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Vialess non-spiral on-chip stacked transformer on high-resistivity silicon for improved RF power transfer efficiency
errMicroelectronic Engineering
IF3.1
err2025-11-04
err0
PREAI
errNajeh Zeidi; Farès Tounsi; Jean-Pierre Raskin; Denis Flandre
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Effect of PN passivation on MOSFETs performance in 28 nm FD-SOI☆
errSOLID-STATE ELECTRONICS
IF1.4
err2025-11-01
err0
PREAI
errVanbrabant, M.; Rack, M.; Cathelin, A.; Raskin, J. P.; Kilchytska, V.
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Traps and radio-frequency characterization of polysilicon layer on high resistivity silicon substrate
errSOLID-STATE ELECTRONICS
IF1.4
err2025-11-01
err0
PREAI
errVandermolen, Eric; Ferrandis, Philippe; Allibert, Frederic; Augendre, Emmanuel; Nabet, Massinissa; Rack, Martin; Raskin, Jean-Pierre; Casse, Mikael
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Post-fab porous silicon in silicon-on-insulator substrates for improved radio frequencies performances
errMaterials Science in Semiconductor Processing
IF4.6
err2025-10-01
err0
PREAI
errRomain Tuyaerts; Gilles Scheen; Khaled Aouadi; Martin Rack; Jean-Pierre Raskin
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Helium nano-bubbles in copper thin films slows down creep under ion irradiation
errACTA MATERIALIA
IF9.3
err2025-04-01
err0
errOAAI
errKhiara, Nargisse; Coulombier, Michael; Raskin, Jean-Pierre; Brechet, Yves; Pardoen, Thomas; Onimus, Fabien
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Phonon-limited mobility for electrons and holes in highly-strained silicon
errNPJ COMPUTATIONAL MATERIALS
IF11.9
err2024-10-12
err0
errOAAI
errRoisin, Nicolas; Brunin, Guillaume; Rignanese, Gian-Marco; Flandre, Denis; Raskin, Jean-Pierre; Ponce, Samuel
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Grain boundary-mediated plasticity in aluminum films unraveled by a statistical approach combining nano-DIC and ACOM-TEM
errACTA MATERIALIA
IF9.3
err2024-09-01
err0
PREAI
errBaral, Paul; Kashiwar, Ankush; Coulombier, Michael; Delannay, Laurent; Hoummada, Khalid; Raskin, Jean Pierre; Idrissi, Hosni; Pardoen, Thomas
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AlN/Si interface engineering to mitigate RF losses in MOCVD-grown GaN-on-Si substrates
errAPPLIED PHYSICS LETTERS
IF3.6
err2024-08-15
err0
errOAAI
errCardinael, Pieter; Yadav, Sachin; Hahn, Herwig; Zhao, Ming; Banerjee, Sourish; Esfeh, Babak Kazemi; Mauder, Christof; O'Sullivan, Barry; Peralagu, Uthayasankaran; Vohra, Anurag; Langer, Robert; Collaert, Nadine; Parvais, Bertrand; Raskin, Jean-Pierre
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Studying ion transport dynamics in electrochemical measurements of lateral flow assays
errJOURNAL OF ELECTROANALYTICAL CHEMISTRY
IF4.1
err2024-08-01
err0
errOAAI
errLe Brun, Gregoire; Calucho, Enric; Hauwaert, Margo; Moumneh, Ramy; Maroli, Gabriel; Yunus, Sami; Rosati, Giulio; Alvarez-Diduk, Ruslan; Piper, Andrew; Merkoci, Arben; Raskin, Jean- Pierre
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Definitive engineering strength and fracture toughness of graphene through on-chip nanomechanics
errNATURE COMMUNICATIONS
IF15.7
err2024-07-12
err1
errOAAI
errJaddi, Sahar; Malik, M. Wasil; Wang, Bin; Pugno, Nicola M.; Zeng, Yun; Coulombier, Michael; Raskin, Jean-Pierre; Pardoen, Thomas
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On-chip very low strain rate rheology of amorphous olivine films
errACTA MATERIALIA
IF9.3
err2024-03-01
err2
errOAAI
errCoulombier, Michael; Baral, Paul; Orekhov, Andrey; Dohmen, Ralf; Raskin, Jean Pierre; Pardoen, Thomas; Cordier, Patrick; Idrissi, Hosni
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Band gap reduction in highly-strained silicon beams predicted by first-principles theory and validated using photoluminescence spectroscopy
errOPTICAL MATERIALS
IF4.2
err2023-10-01
err1
errOAAI
errRoisin, Nicolas; Colla, Marie-Stephane; Scaffidi, Romain; Pardoen, Thomas; Flandre, Denis; Raskin, Jean-Pierre
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errSave
Ultra-low-energy catalytic degradation of ozone by off-stoichiometric delafossite Cu-Cr-O for highly selective low-temperature solid-state O3 sensors
errMATERIALS TODAY ADVANCES
IF8
err2023-06-01
err2
errOAAI
errAfonso, Joao R.; Greiner, Mark; Lunca-Popa, Petru; Raskin, Jean-Pierre; Lenoble, Damien
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errSave
Enhanced Gas Detection by Altering Gate Voltage Polarity of Polypyrrole/Graphene Field-Effect Transistor Sensor
errCHEMOSENSORS
IF3.7
err2022-11-09
err6
errOAAI
errTang, Xiaohui; Raskin, Jean-Pierre; Reckinger, Nicolas; Yan, Yiyi; Andre, Nicolas; Lahem, Driss; Debliquy, Marc
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errSave
Variation Range of Different Inductor Topologies with Shields for RF and Inductive Sensing Applications
errSENSORS
IF3.5
err2022-05-05
err3
errOAAI
errTounsi, Fares; Said, Mohamed Hadj; Hauwaert, Margo; Kaziz, Sinda; Francis, Laurent A.; Raskin, Jean-Pierre; Flandre, Denis
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errSave
Estimation of the Young's Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers
errNANOMATERIALS
IF4.3
err2022-01-14
err2
errOAAI
errVelosa-Moncada, Luis A.; Raskin, Jean-Pierre; Aguilera-Cortes, Luz Antonio; Lopez-Huerta, Francisco; Herrera-May, Agustin L.
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errSave
Rheology of amorphous olivine thin films characterized by nanoindentation
errACTA MATERIALIA
IF9.3
err2021-10-01
err16
errOAAI
errBaral, Paul; Orekhov, Andrey; Dohmen, Ralf; Coulombier, Michael; Raskin, Jean Pierre; Cordier, Patrick; Idrissi, Hosni; Pardoen, Thomas
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errSave
In-situ TEM irradiation creep experiment revealing radiation induced dislocation glide in pure copper
errACTA MATERIALIA
IF9.3
err2021-09-01
err17
errOAAI
errKhiara, Nargisse; Onimus, Fabien; Jublot-Leclerc, Stephanie; Jourdan, Thomas; Pardoen, Thomas; Raskin, Jean-Pierre; Brechet, Yves
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Research Directions

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Co-authors
Cooperation Journals
廖雷 cover
廖雷 (Lei Liao)
H-index: 104 · Papers: 765
A
Arben Merkoçi
H-index: 93 · Papers: 504
A
Ado Jório
H-index: 89 · Papers: 414
Y
Y. Bréchet
H-index: 73 · Papers: 550
N
Nicola M. Pugno
H-index: 72 · Papers: 1.1K
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