Haeffner, Tim D. - Publications & Citations

Haeffner, Tim D.

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Back-Biasing Strategy to Mitigate TID-Induced Threshold Voltage Shift in 22-nm FDSOI Transistors 22-nm FDSOI晶体管中缓解总剂量效应引起的阈值电压漂移的背偏策略

IEEE Transactions on Nuclear Science

IF1.9

2026-04-01

PREAI

Dean, Berkay R.; Hu, Michael D.; Haeffner, Tim D.; Kauppila, Jeff S.; Alles, Michael L.; Trippe, James M.; Ball, Dennis R.; Sierawski, Brian D.; Holman, Timothy W.; Kosier, Steven L.; Massengill, Lloyd W.

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