Hu, Michael D. - Publications & Citations

Hu, Michael D.

vanderbilt university

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2论文数

0被引数

收录论文 2

发表时间

Back-Biasing Strategy to Mitigate TID-Induced Threshold Voltage Shift in 22-nm FDSOI Transistors 22-nm FDSOI晶体管中缓解总剂量效应引起的阈值电压漂移的背偏策略

IEEE Transactions on Nuclear Science

IF1.9

2026-04-01

PREAI

Dean, Berkay R.; Hu, Michael D.; Haeffner, Tim D.; Kauppila, Jeff S.; Alles, Michael L.; Trippe, James M.; Ball, Dennis R.; Sierawski, Brian D.; Holman, Timothy W.; Kosier, Steven L.; Massengill, Lloyd W.

Trends in 45 nm Integrated Circuit Single-Event Upset Rates With Stacked-Transistor Layouts 45纳米集成电路中采用堆叠晶体管布局的单粒子翻转率趋势

IEEE Transactions on Nuclear Science

IF1.9

2026-04-01

PREAI

Hu, Michael D.; Trippe, James M.; Reed, Robert A.; Sierawski, Brian D.; Ball, Dennis R.; Kauppila, Jeffrey S.; Massengill, Lloyd W.; Holman, W. Timothy

研究方向