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Timothy W. Holman

vanderbilt university

2H指数
5论文数
40被引数
收录论文 1
发表时间
Back-Biasing Strategy to Mitigate TID-Induced Threshold Voltage Shift in 22-nm FDSOI Transistors22-nm FDSOI晶体管中缓解总剂量效应引起的阈值电压漂移的背偏策略
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PREAI
errDean, Berkay R.; Hu, Michael D.; Haeffner, Tim D.; Kauppila, Jeff S.; Alles, Michael L.; Trippe, James M.; Ball, Dennis R.; Sierawski, Brian D.; Holman, Timothy W.; Kosier, Steven L.; Massengill, Lloyd W.
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