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Anton J. Bauer

University of Erlangen Nuremberg

27H指数
339论文数
2.7K被引数
收录论文 17
发表时间
Feasibility of 4H-SiC p-i-n Diode for Sensitive Temperature Measurements Between 20.5 K and 802 K4H-SiC p-i-n二极管用于20.5 K至802 K敏感温度测量的可行性
err2019-04-15
err19
PREAI
errMatthus, Christian D.; Di Benedetto, Luigi; Kocher, Matthias; Bauer, Anton J.; Licciardo, Gian Domenico; Rubino, Alfredo; Erlbacher, Tobias
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Wavelength-selective 4H-SiC UV-sensor array
err2019-02-01
err14
PREAI
errMatthus, Christian D.; Bauer, Anton J.; Frey, Lothar; Erlbacher, Tobias
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Tailoring the Electrical Properties of HfO2 MOS-Devices by Aluminum Doping
err2015-07-30
err32
PREAI
errPaskaleva, Albena; Rommel, Mathias; Hutzler, Andreas; Spassov, Dencho; Bauer, Anton J.
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Impact of acceptor concentration on electrical properties and density of interface states of 4H-SiC n-metal-oxide-semiconductor field effect transistors studied by Hall effect
err2015-02-10
err28
errOAAI
errOrtiz, G.; Strenger, C.; Uhnevionak, V.; Burenkov, A.; Bauer, A. J.; Pichler, P.; Cristiano, F.; Bedel-Pereira, E.; Mortet, V.
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Nanoscale Characterization of TiO2 Films Grown by Atomic Layer Deposition on RuO2 Electrodes
err2014-02-10
err24
errOAAI
errMurakami, Katsuhisa; Rommel, Mathias; Hudec, Boris; Rosova, Alica; Husekova, Kristina; Dobrocka, Edmund; Rammula, Raul; Kasikov, Aarne; Han, Jeong Hwan; Lee, Woongkyu; Song, Seul Ji; Paskaleva, Albena; Bauer, Anton J.; Frey, Lothar; Froehlich, Karol; Aarik, Jaan; Hwang, Cheol Seong
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Thickness mapping of high-κ dielectrics at the nanoscale
err2014-02-04
err0
errOAAI
errTrapnauskas, J.; Rommel, M.; Bauer, A. J.; Frey, L.
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A novel PWM control for a bi-directional full-bridge DC-DC converter with smooth conversion mode transitions
err2011-08-01
err0
errOAAI
errLorentz, V. R. H.; Schwarzmann, H.; Maerz, M.; Bauer, A. J.; Ryssel, H.; Frey, L.; Poure, P.; Braun, F.
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Lossless average inductor current sensor for CMOS integrated DC-DC converters operating at high frequencies
err2009-08-19
err5
PREAI
errLorentz, V. R. H.; Berberich, S. E.; Maerz, M.; Bauer, A. J.; Ryssel, H.; Poure, P.; Braun, F.
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Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics
err2008-06-27
err82
errOAAI
errYanev, Vasil; Rommel, Mathias; Lemberger, Martin; Petersen, Silke; Amon, Brigitte; Erlbacher, Tobias; Bauer, Anton J.; Ryssel, Heiner; Paskaleva, Albena; Weinreich, Wenke; Fachmann, Christian; Heitmann, Johannes; Schroeder, Uwe
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MOCVD of tantalum nitride thin films from TBTEMT single source precursor as metal electrodes in CMOS applications
err2007-09-01
err15
PREAI
errLemberger, M.; Thiemann, S.; Baunemann, A.; Parala, H.; Fischer, R. A.; Hinz, J.; Bauer, A. J.; Ryssel, H.
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Stress induced leakage current mechanism in thin Hf-silicate layers
err2007-01-24
err12
PREAI
errPaskaleva, A.; Lemberger, M.; Bauer, A. J.
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Zirconium silicate films obtained from novel MOCVD precursors
err2003-07-01
err24
PREAI
errLemberger, M; Paskaleva, A; Zürcher, S; Bauer, AJ; Frey, L; Ryssel, H
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Effect of barium contamination on gate oxide integrity in high-k dram
err2002-05-01
err1
PREAI
errBoubekeur, H; Mikolajick, T; Bauer, A; Frey, L; Ryssel, H
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MOCVD of titanium dioxide on the basis of new precursors
err2002-05-01
err21
PREAI
errLeistner, T; Lehmbacher, K; Härter, P; Schmidt, C; Bauer, AJ; Frey, L; Ryssel, H
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