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Soomin Kim

pohang university of science and technology

0H指数
3论文数
0被引数
收录论文 2
发表时间
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Stepwise and selective missing-value imputation for machine learning-based process monitoring and diagnosis of high-speed DRAM peripheral devices基于机器学习的高速DRAM外围设备过程监控与诊断的逐步选择性缺失值插补
errMaterials Today Electronics
IF7.4
err2026-05-01
err0
PREAI
errKang, Sinyeong; Yun, Hyeok; Cho, Kyeongrae; Eom, Seungjoon; Kim, Soomin; Kim, Minchan; Jeong, Seongsoo; Baek, Rock-Hyun
err分享
err收藏
Machine Learning-Driven Variability Analysis of Process Parameters for Semiconductor Manufacturing机器学习驱动的半导体制造工艺参数变异性分析
errAdvanced Intelligent Systems
IF6.1
err2026-03-06
err0
errOAAI
errSinyeong Kang; Hyeok Yun; Kyeongrae Cho; Seungjoon Eom; Soomin Kim; Seongsoo Jeong; Rockhyun Baek
err分享
err收藏

研究方向

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合作学者
合作期刊
R
Rock‐Hyun Baek
H 指数: 23 · 论文数: 166
H
Hyeok Yun
H 指数: 7 · 论文数: 25
K
Kyeongrae Cho
H 指数: 4 · 论文数: 13
K
Kyeongrae Cho
H 指数: 2 · 论文数: 11
M
Minchan Kim
H 指数: 2 · 论文数: 12
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