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K

Kyeongrae Cho

pohang university of science and technology

4H指数
13论文数
29被引数
收录论文 8
发表时间
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Stepwise and selective missing-value imputation for machine learning-based process monitoring and diagnosis of high-speed DRAM peripheral devices基于机器学习的高速DRAM外围设备过程监控与诊断的逐步选择性缺失值插补
errMaterials Today Electronics
IF7.4
err2026-05-01
err0
PREAI
errKang, Sinyeong; Yun, Hyeok; Cho, Kyeongrae; Eom, Seungjoon; Kim, Soomin; Kim, Minchan; Jeong, Seongsoo; Baek, Rock-Hyun
err分享
err收藏
Physics-Assisted Neural Network Modeling of Advanced Recessed-3D nand Cells Under Sparse-Data Conditions基于稀疏数据条件下先进凹陷式3D nand单元的物理辅助神经网络建模
errIEEE Transactions on Electron Devices
IF3.2
err2026-03-10
err0
PREAI
errKyeongrae Cho; Soomin Kim; Seungjoon Eom; Sinyeong Kang; Seongsoo Jeong; Rock-Hyun Baek
err分享
err收藏
Accurate ML-Based Prediction of Next-Generation nand With Limited Data Using Generative AI and Transfer Learning基于生成式人工智能和迁移学习的下一代NAND有限数据下的准确机器学习预测
errIEEE Transactions on Electron Devices
IF3.2
err2026-03-10
err0
PREAI
errSoomin Kim; Kyeongrae Cho; Seungjoon Eom; Donghyun Kim; Sinyeong Kang; Seongsoo Jeong; Rock-Hyun Baek
err分享
err收藏
Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation用于高精度灵活模型参数选择和快速SPICE仿真的神经紧凑建模框架
errADVANCED INTELLIGENT SYSTEMS
IF6.1
err2024-01-06
err2
errOAAI
errEom, Seungjoon; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Lee, Seunghwan; Jeong, Jinsu; Baek, Rock-Hyun
err分享
err收藏
Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application基于图神经网络的三维NAND交叉温度特性建模及其应用
errADVANCED INTELLIGENT SYSTEMS
IF6.1
err2023-10-09
err2
errOAAI
errCho, Kyeongrae; Lee, Jeong-Sik; Park, Chanyang; Yun, Hyeok; Jang, Hyundong; Eom, Seungjoon; Park, Min Sang; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏
Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development用于半导体工艺监控和技术开发的神经网络的准确预测和可靠参数优化
errADVANCED INTELLIGENT SYSTEMS
IF6.1
err2023-07-08
err1
errOAAI
errYun, Hyeok; An, Chang-Hyeon; Jang, Hyundong; Cho, Kyeongrae; Lee, Jeong-Sik; Eom, Seungjoon; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏
Optimal Energetic-Trap Distribution of Nano-Scaled Charge Trap Nitride for Wider Vth Window in 3D NAND Flash Using a Machine-Learning Method
errNANOMATERIALS
IF4.3
err2022-05-25
err1
errOAAI
errNam, Kihoon; Park, Chanyang; Yoon, Jun-Sik; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Kang, Ho-Jung; Park, Min-Sang; Sim, Jaesung; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm
errIEEE ACCESS
IF3.6
err2022-01-01
err2
errOAAI
errJang, Hyundong; Yun, Hyeok; Park, Chanyang; Cho, Kyeongrae; Nam, Kihoon; Yoon, Jun-Sik; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
C
Choong‐Ki Kim
H 指数: 32 · 论文数: 210
M
Min Sang Park
H 指数: 26 · 论文数: 115
J
Jun-Sik Yoon
H 指数: 25 · 论文数: 98
R
Rock‐Hyun Baek
H 指数: 23 · 论文数: 166
S
Seunghwan Lee
H 指数: 17 · 论文数: 86
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