Hyeok Yun - Publications, H-index & Citations

Hyeok Yun

sk group

7H指数

25论文数

203被引数

收录论文 15

发表时间

Stepwise and selective missing-value imputation for machine learning-based process monitoring and diagnosis of high-speed DRAM peripheral devices 基于机器学习的高速DRAM外围设备过程监控与诊断的逐步选择性缺失值插补

Materials Today Electronics

IF7.4

2026-05-01

PREAI

Kang, Sinyeong; Yun, Hyeok; Cho, Kyeongrae; Eom, Seungjoon; Kim, Soomin; Kim, Minchan; Jeong, Seongsoo; Baek, Rock-Hyun

Machine Learning-Driven Variability Analysis of Process Parameters for Semiconductor Manufacturing 机器学习驱动的半导体制造工艺参数变异性分析

Advanced Intelligent Systems

IF6.1

2026-03-06

OAAI

Sinyeong Kang; Hyeok Yun; Kyeongrae Cho; Seungjoon Eom; Soomin Kim; Seongsoo Jeong; Rockhyun Baek

Machine Learning-Driven Extraction of Hybrid Compact Models Integrating Neural Networks and Berkeley Short-Channel Insulated-Gate Field-Effect Transistor Model-Common Multigate for Multidevice Applications 机器学习驱动的混合紧凑模型的提取集成了神经网络和Berkeley短沟道绝缘栅场效应晶体管模型-用于多设备应用的通用多栅极

ADVANCED INTELLIGENT SYSTEMS

IF6.1

2024-11-11

OAAI

Eom, Seungjoon; Lee, Seunghwan; Yun, Hyeok; Cho, Kyeongrae; Kim, Soomin; Baek, Rockhyun

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring 用于整体半导体工艺监控的神经网络的非线性变化分解

ADVANCED INTELLIGENT SYSTEMS

IF6.1

2024-09-04

OAAI

Yun, Hyeok; Jang, Hyundong; Lee, Seunghwan; Lee, Junjong; Cho, Kyeongrae; Eom, Seungjoon; Kim, Soomin; Kim, Choong-Ki; Byun, Hong-Chul; Han, Seongjoo; Yoo, Min-Soo; Baek, Rock-Hyun

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation 用于高精度灵活模型参数选择和快速SPICE仿真的神经紧凑建模框架

ADVANCED INTELLIGENT SYSTEMS

IF6.1

2024-01-06

OAAI

Eom, Seungjoon; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Lee, Seunghwan; Jeong, Jinsu; Baek, Rock-Hyun

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations

IEEE ACCESS

IF3.6

2024-01-01

OAAI

Lee, Seunghwan; Eom, Seungjoon; Jeong, Jinsu; Lee, Junjong; Lee, Sanguk; Yun, Hyeok; Ahn, Yonghwan; Baek, Rock-Hyun

Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application 基于图神经网络的三维NAND交叉温度特性建模及其应用

ADVANCED INTELLIGENT SYSTEMS

IF6.1

2023-10-09

OAAI

Cho, Kyeongrae; Lee, Jeong-Sik; Park, Chanyang; Yun, Hyeok; Jang, Hyundong; Eom, Seungjoon; Park, Min Sang; Choi, Hyun-Chul; Baek, Rock-Hyun

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development 用于半导体工艺监控和技术开发的神经网络的准确预测和可靠参数优化

ADVANCED INTELLIGENT SYSTEMS

IF6.1

2023-07-08

OAAI

Yun, Hyeok; An, Chang-Hyeon; Jang, Hyundong; Cho, Kyeongrae; Lee, Jeong-Sik; Eom, Seungjoon; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Hyun-Chul; Baek, Rock-Hyun

Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning

IEEE ACCESS

IF3.6

2023-01-01

OAAI

Nam, Kihoon; Park, Chanyang; Yun, Hyeok; Yoon, Jun-Sik; Jang, Hyundong; Cho, Kyeongrae; Park, Min Sang; Choi, Hyun-Chul; Baek, Rock-Hyun

Optimal Energetic-Trap Distribution of Nano-Scaled Charge Trap Nitride for Wider Vth Window in 3D NAND Flash Using a Machine-Learning Method

NANOMATERIALS

IF4.3

2022-05-25

OAAI

Nam, Kihoon; Park, Chanyang; Yoon, Jun-Sik; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Kang, Ho-Jung; Park, Min-Sang; Sim, Jaesung; Choi, Hyun-Chul; Baek, Rock-Hyun

Novel Modeling Approach to Analyze Threshold Voltage Variability in Short Gate-Length (15-22 nm) Nanowire FETs with Various Channel Diameters

NANOMATERIALS

IF4.3

2022-05-18

OAAI

Lee, Seunghwan; Yoon, Jun-Sik; Lee, Junjong; Jeong, Jinsu; Yun, Hyeok; Lim, Jaewan; Lee, Sanguk; Baek, Rock-Hyun

Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm

IEEE ACCESS

IF3.6

2022-01-01

OAAI

Jang, Hyundong; Yun, Hyeok; Park, Chanyang; Cho, Kyeongrae; Nam, Kihoon; Yoon, Jun-Sik; Choi, Hyun-Chul; Baek, Rock-Hyun