Thomas F. K. Weatherley - Publications, H-index & Citations

Thomas F. K. Weatherley

swiss federal institutes of technology domain

5H指数

16论文数

122被引数

收录论文 6

发表时间

GaN Surface Passivation by MoS2 Coating

NANO LETTERS

IF9.1

2024-08-12

OAAI

Chen, Danxuan; Jiang, Jin; Weatherley, Thomas F. K.; Carlin, Jean-Francois; Banerjee, Mitali; Grandjean, Nicolas

Optical and thermal characterization of a group-III nitride semiconductor membrane by microphotoluminescence spectroscopy and Raman thermometry

PHYSICAL REVIEW B

IF3.7

2023-12-29

OAAI

Elhajhasan, Mahmoud; Seemann, Wilken; Dudde, Katharina; Vaske, Daniel; Callsen, Gordon; Rousseau, Ian; Weatherley, Thomas F. K.; Carlin, Jean-Francois; Butte, Raphael; Grandjean, Nicolas; Protik, Nakib H.; Romano, Giuseppe

Investigation of the Impact of Point Defects in InGaN/GaN Quantum Wells with High Dislocation Densities

NANOMATERIALS

IF4.3

2023-09-16

OAAI

Lottigier, Pierre; Di Paola, Davide Maria; Alexander, Duncan T. L.; Weatherley, Thomas F. K.; Modrono, Pablo Saenz de Santa Maria; Chen, Danxuan; Jacopin, Gwenole; Carlin, Jean-Francois; Butte, Raphael; Grandjean, Nicolas

Imaging Nonradiative Point Defects Buried in Quantum Wells Using Cathodoluminescence

NANO LETTERS

IF9.1

2021-06-04

OAAI

Weatherley, Thomas F. K.; Liu, Wei; Osokin, Vitaly; Alexander, Duncan T. L.; Taylor, Robert A.; Carlin, Jean-Francois; Butte, Raphael; Grandjean, Nicolas

Impact of defects on Auger recombination in c-plane InGaN/GaN single quantum well in the efficiency droop regime

APPLIED PHYSICS LETTERS

IF3.6

2020-06-04

OAAI

Liu, W.; Haller, C.; Chen, Y.; Weatherley, T.; Carlin, J. -F.; Jacopin, G.; Butte, R.; Grandjean, N.

Characterisation of InGaN by Photoconductive Atomic Force Microscopy

MATERIALS

IF3.2

2018-09-21

OAAI

Weatherley, Thomas F. K.; Massabuau, Fabien C. -P.; Kappers, Menno J.; Oliver, Rachel A.

研究方向