Erlbacher, Tobias - Publications & Citations

Erlbacher, Tobias

fraunhofer gesellschaft

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收录论文 15

发表时间

Performance Investigation of 4H-SiC PIN Photodiodes With Dual-Emitter Designs for Enhanced UV-C Detection 4H-SiC PIN光电二极管在双发射极设计下对增强UVC检测的性能研究

IEEE SENSORS LETTERS

IF2.2

2025-10-01

PREAI

Schraml, Michael W.; Rommel, Mathias; Papathanasiou, Niklas; May, Alexander; Erlbacher, Tobias; Schulze, Joerg

Very High Temperature Hall Sensors in a Wafer-Scale 4H-SiC Technology 晶圆级4H-SiC技术中的极高温霍尔传感器

ADVANCED MATERIALS TECHNOLOGIES

IF6.2

2024-08-07

OAAI

Okeil, Hesham; Erlbacher, Tobias; Wachutka, Gerhard

Adjustable Current Limiting Function With a Monolithically Integrated SiC Circuit Breaker Device

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS

IF4.5

2023-09-01

OAAI

Takamori, Taro; Wada, Keiji; Boettcher, Norman; Erlbacher, Tobias; Saito, Wataru; Nishizawa, Shin-ichi

Microfabricated albedo insensitive sun position sensor system in silicon carbide with integrated 3D optics and CMOS electronics

SENSORS AND ACTUATORS A-PHYSICAL

IF4.9

2023-05-01

OAAI

Romijn, Joost; Vollebregt, Sten; de Bie, Vincent G.; Middelburg, Luke M.; El Mansouri, Brahim; van Zeijl, Henk W.; May, Alexander; Erlbacher, Tobias; Leijtens, Johan; Zhang, Guoqi; Sarro, Pasqualina M.

Integrated 64 pixel UV image sensor and readout in a silicon carbide CMOS technology

MICROSYSTEMS & NANOENGINEERING

IF9.9

2022-10-25

OAAI

Romijn, Joost; Vollebregt, Sten; Middelburg, Luke M.; El Mansouri, Brahim; van Zeijl, Henk W.; May, Alexander; Erlbacher, Tobias; Leijtens, Johan; Zhang, Guoqi; Sarro, Pasqualina M.

Defect reduction in SiC epilayers by different substrate cleaning methods

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2022-03-01

PREAI

Baierhofer, D.; Thomas, B.; Staiger, F.; Marchetti, B.; Foerster, C.; Erlbacher, T.

Mechanisms of Ohmic Contact Formation of Ti/Al-Based Metal Stacks on p-Doped 4H-SiC

MATERIALS

IF3.2

2021-12-22

OAAI

Kocher, Matthias; Rommel, Mathias; Michalowski, Pawel Piotr; Erlbacher, Tobias

The impact of dislocations on AlGaN/GaN Schottky diodes and on gate failure of high electron mobility transistors

SCIENTIFIC REPORTS

IF3.9

2020-10-14

OAAI

Besendoerfer, Sven; Meissner, Elke; Medjdoub, Farid; Derluyn, Joff; Friedrich, Jochen; Erlbacher, Tobias

Feasibility of 4H-SiC p-i-n Diode for Sensitive Temperature Measurements Between 20.5 K and 802 K 4H-SiC p-i-n二极管用于20.5 K至802 K敏感温度测量的可行性

IEEE SENSORS JOURNAL

IF4.5

2019-04-15

PREAI

Matthus, Christian D.; Di Benedetto, Luigi; Kocher, Matthias; Bauer, Anton J.; Licciardo, Gian Domenico; Rubino, Alfredo; Erlbacher, Tobias

Wavelength-selective 4H-SiC UV-sensor array

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2019-02-01

PREAI

Matthus, Christian D.; Bauer, Anton J.; Frey, Lothar; Erlbacher, Tobias

The GaN trench gate MOSFET with floating islands: High breakdown voltage and improved BFOM 具有浮岛的GaN沟槽栅MOSFET: 高击穿电压和改进的BFOM

SUPERLATTICES AND MICROSTRUCTURES

IF3.3

2018-02-01

PREAI

Shen, Lingyan; Mueller, Stephan; Cheng, Xinhong; Zhang, Dongliang; Zheng, Li; Xu, Dawei; Yu, Yuehui; Meissner, Elke; Erlbacher, Tobias

Optimization of 4H-SiC UV Photodiode Performance Using Numerical Process and Device Simulation

IEEE SENSORS JOURNAL

IF4.5

2016-06-01

PREAI

Burenkov, Alex; Matthus, Christian D.; Erlbacher, Tobias

Feasibility and limitations of anti-fuses based on bistable non-volatile switches for power electronic applications 基于双稳态非易失性开关的反熔断器在电力电子应用中的可行性和局限性

SOLID-STATE ELECTRONICS

IF1.4

2012-09-01

PREAI

Erlbacher, T.; Huerner, A.; Bauer, A. J.; Frey, L.

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics

APPLIED PHYSICS LETTERS

IF3.6

2008-06-27

OAAI

Yanev, Vasil; Rommel, Mathias; Lemberger, Martin; Petersen, Silke; Amon, Brigitte; Erlbacher, Tobias; Bauer, Anton J.; Ryssel, Heiner; Paskaleva, Albena; Weinreich, Wenke; Fachmann, Christian; Heitmann, Johannes; Schroeder, Uwe

Self-aligned growth of organometallic layers for nonvolatile memories: Comparison of liquid-phase and vapor-phase deposition

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2008-01-01

OAAI

Erlbacher, Tobias; Jank, Michael P. M.; Ryssel, Heiner; Frey, Lothar; Engl, Reimund; Walter, Andreas; Sezi, Recai; Dehm, Christine

研究方向