logo
科言猫学术研究的AI总结
language
手机端手机端
  • Phone Feature微信小程序
简体中文简体中文
notice消息通知
博客博客
delete
arrow
返回
H

Hyundong Jang

机构信息待补充

6H指数
19论文数
85被引数
收录论文 9
发表时间
logo
Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring用于整体半导体工艺监控的神经网络的非线性变化分解
errADVANCED INTELLIGENT SYSTEMS
IF6.1
err2024-09-04
err0
errOAAI
errYun, Hyeok; Jang, Hyundong; Lee, Seunghwan; Lee, Junjong; Cho, Kyeongrae; Eom, Seungjoon; Kim, Soomin; Kim, Choong-Ki; Byun, Hong-Chul; Han, Seongjoo; Yoo, Min-Soo; Baek, Rock-Hyun
err分享
err收藏
Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation用于高精度灵活模型参数选择和快速SPICE仿真的神经紧凑建模框架
errADVANCED INTELLIGENT SYSTEMS
IF6.1
err2024-01-06
err2
errOAAI
errEom, Seungjoon; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Lee, Seunghwan; Jeong, Jinsu; Baek, Rock-Hyun
err分享
err收藏
Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application基于图神经网络的三维NAND交叉温度特性建模及其应用
errADVANCED INTELLIGENT SYSTEMS
IF6.1
err2023-10-09
err2
errOAAI
errCho, Kyeongrae; Lee, Jeong-Sik; Park, Chanyang; Yun, Hyeok; Jang, Hyundong; Eom, Seungjoon; Park, Min Sang; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏
Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development用于半导体工艺监控和技术开发的神经网络的准确预测和可靠参数优化
errADVANCED INTELLIGENT SYSTEMS
IF6.1
err2023-07-08
err1
errOAAI
errYun, Hyeok; An, Chang-Hyeon; Jang, Hyundong; Cho, Kyeongrae; Lee, Jeong-Sik; Eom, Seungjoon; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏
Investigation of Program Efficiency Overshoot in 3D Vertical Channel NAND Flash with Randomly Distributed Traps
errNANOMATERIALS
IF4.3
err2023-04-24
err0
errOAAI
errPark, Chanyang; Yoon, Jun-Sik; Nam, Kihoon; Jang, Hyundong; Park, Minsang; Baek, Rock-Hyun
err分享
err收藏
Quantitative analysis of irregular channel shape effects on charge-trapping efficiency using massive 3D NAND data
errMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
IF4.6
err2023-04-01
err4
PREAI
errPark, Chanyang; Yoon, Jun-Sik; Nam, Kihoon; Jang, Hyundong; Park, Min Sang; Baek, Rock-Hyun
err分享
err收藏
Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning
errIEEE ACCESS
IF3.6
err2023-01-01
err6
errOAAI
errNam, Kihoon; Park, Chanyang; Yun, Hyeok; Yoon, Jun-Sik; Jang, Hyundong; Cho, Kyeongrae; Park, Min Sang; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏
Optimal Energetic-Trap Distribution of Nano-Scaled Charge Trap Nitride for Wider Vth Window in 3D NAND Flash Using a Machine-Learning Method
errNANOMATERIALS
IF4.3
err2022-05-25
err1
errOAAI
errNam, Kihoon; Park, Chanyang; Yoon, Jun-Sik; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Kang, Ho-Jung; Park, Min-Sang; Sim, Jaesung; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏
Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm
errIEEE ACCESS
IF3.6
err2022-01-01
err2
errOAAI
errJang, Hyundong; Yun, Hyeok; Park, Chanyang; Cho, Kyeongrae; Nam, Kihoon; Yoon, Jun-Sik; Choi, Hyun-Chul; Baek, Rock-Hyun
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
C
Choong‐Ki Kim
H 指数: 32 · 论文数: 210
M
Min Sang Park
H 指数: 26 · 论文数: 115
J
Jun-Sik Yoon
H 指数: 25 · 论文数: 98
R
Rock‐Hyun Baek
H 指数: 23 · 论文数: 166
S
Seunghwan Lee
H 指数: 17 · 论文数: 86
查看更多